Anodic Oxides on Hg_<1-x>Cd_xTe Studied Using Angle and X-Ray Power-Dependent X-Ray Photoelectron Spectroscopy

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概要

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• The surface composition of the anodic oxidation film on Hg_<0.8>Co_<0.2>Te (MCT) has been studied by means of angle and X-ray power-dependent X-ray photoelectron spectroscopy (XPS) techniques. The anodic oxidation film is composed of oxides and hydroxides, in which a tellurium oxide with a low valence is involved. The hydroxides are more predominant in the outermost layer. The low valence oxide (Te^<2+>) is changed to a high valence oxide (Te^<4+>) with X-ray power higher than 40 W. Furthermore, such high-power irradiation induces evaporation of mercury oxides and/or hydroxides and conversion of hydroxides to oxides. These changes are observed also in the spectrum obtained under monochromatized X-ray irradiation.

• 社団法人応用物理学会の論文
• 1992-07-15

著者

• Shimanoe Kengo

  Advanced Materials & Technology Research Laboratories Nippon Steel Corporation

• Sakashita Masao

  Advanced Materials & Technology Research Laboratories Nippon Steel Corporation

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• Anodic Oxides on Hg_Cd_xTe Studied Using Angle and X-Ray Power-Dependent X-Ray Photoelectron Spectroscopy
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