Specular Reflectance Curves of Wax-Polished Painted Surface : Determination of Wax-Film Thickness and rms Roughness

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概要

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• The reflectance curves of wax-polished painted surface, for p-polarized light of three wavelengths (641, 548 and 435 mμ), near the Brewster angle are classified into three groups. They are analyzed in connection with varied states of wax spread on the painted surface. The analysis is based on an expression introduced in the preceding paper for the specular reflectance of a uniformly filmed rough plane surface. The following results are given: When the wax-film is uniform in thickness its thickness lies between 750 and 400Å, and the surface becomes partially filmed when the thickness is below 400Å. The rms roughness of the painted surface is 400∼500Å.

• 社団法人応用物理学会の論文
• 1967-10-05

著者

• Nagata Ken-ichi

  Department Of Physics Faculty Of Science Tokyo Metropolitan University

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