Reflection of Light from Filmed Rough Surface: Determination of Film Thickness and rms Roughness

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概要

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• The specular reflection of light from non-conducting slightly random surfaces which are uniformly or partially filmed, is investigated in a statistical manner. The film is assumed to be thin, transparent and uniform in thickness. Two possible methods for determining its thickness d, rms roughness σ and, if necessary, refractive index are introduced. One method uses the minima of specular reflectance curves near the Brewster angle and the other uses the reflectance values directly. The latter can apply only up to σ/λ=0.025, where λ is wavelength, owing to the effect of diffuse reflection. The former is almost free from this effect, does not require the absolute value of reflectance and enables one to discriminate whether the surface is filmed uniformly or partially.

• 社団法人応用物理学会の論文
• 1967-02-15

著者

• Nagata Ken-ichi

  Department Of Physics Faculty Of Science Tokyo Metropolitan University

• Nishiwaki Jien

  Department Of Physics Faculty Of Science Tokyo Metropolitan University

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