Stress Effect on the Microwave Emission from Si Avalanche Diodes

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1966-08-15

著者

• Okuto Yuzi

  Central Research Laboratories Nippon Electric Co. Ltd.

• Uchida Ichizo

  Central Research Laboratories Nippon Electric Co. Ltd.

• KONDO Motoki

  Central Research Laboratories, Nippon Electric Co., Ltd.

• Kondo Motoki

  Central Research Laboratories Nippon Electric Co. Ltd.

関連論文

• Stress Effect on the Microwave Emission from Si Avalanche Diodes
• Build-up Time of the First and the Second Current Saturation in a CdS Single Crystal
• Two Kinds of Current Saturation on Non-Ohmic Behavior in CdS
• The Second Current Saturation of Non-Ohmic Behavior in CdS Single Crystals
• Two Steps Saturation of Pulsed Current in CdS Single Crystals
• The Electric and the Magnetic Field Dependence of Electrical Conductivity of n-Ge at Low Temperature
• Current Dependence of Frequency in Si IMPATT Diodes
• Effect of Field Distribution of Silicon p-n-n^+ Avalanche Diodes on Efficiency
• Low Frequency Oscillation Induced by Anormalous Avalanche Negative Resistance in p-i-n Diodes
• Instability in the Avalanche Region of Si p-i-n Diodes

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