Accurate Determination of a Low-Order Fourier Coefficient of the Potential of Alumninium Single Crystals by a Modified Thickness Fringe Method
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1980-05-05
著者
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Uefuji Tateki
Electronics Department Faculty Of Science And Engineering Saga University
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KUWABARA Shigeya
Electronics Department, Faculty of Science and Engineering, Saga University
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INOKUCHI Masayuki
Electronics Department, Faculty of Science and Engineering, Saga University
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Inokuchi Masayuki
Electronics Department Faculty Of Science And Engineering Saga University
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Kuwabara Shigeya
Electronics Department Faculty Of Science And Engineering Saga University
関連論文
- Corrections of Cartographic Electron Microscopic Images Obtained by Mollenstedt Type Filter
- Accurate Determination of a Low-Order Fourier Coefficient of the Potential of Alumninium Single Crystals by a Modified Thickness Fringe Method
- Correction of Mollenstedt Filter Images by Auxiliary Lenses and the Observation of Bend Contours of Aluminium Single Crystals
- Calculation of Inelastic Scattering Effect in the Bend Contour Electron Microscopic Images of Aluminium Single Crystals by n-Slice Approximation