Calculation of Inelastic Scattering Effect in the Bend Contour Electron Microscopic Images of Aluminium Single Crystals by n-Slice Approximation

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概要

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• Electron microscopic images of bend contours given by single crystal aluminiumfilms have been calculated, by use of the multi-slice approximation to n-beamdynanaical theory, for elastically scattered electrons and for electrons inelasticallyscattered by several different processes. The effects of the size and position of theobjective aperture are taken into account. Contparison with experimental observa-tions shows good agreement.

• 社団法人日本物理学会の論文
• 1977-06-15

著者

• Kuwabara Shigeya

  Electronics Department Faculty Of Science And Engineering Saga University

• Cowley J.M.

  Department of Physics,Arizona State University

• Cowley J.M.

  Department of Physics and Astronomy, Arizona State University

関連論文

• Corrections of Cartographic Electron Microscopic Images Obtained by Mollenstedt Type Filter
• Accurate Determination of a Low-Order Fourier Coefficient of the Potential of Alumninium Single Crystals by a Modified Thickness Fringe Method
• Correction of Mollenstedt Filter Images by Auxiliary Lenses and the Observation of Bend Contours of Aluminium Single Crystals
• Calculation of Inelastic Scattering Effect in the Bend Contour Electron Microscopic Images of Aluminium Single Crystals by n-Slice Approximation

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