Electrical Properties of MAOS Structures as Revealed by Conductance Technique

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1972-07-05

著者

• Ohta Kuniichi

  Ic Division Nippon Electric Company

• Ohta Kuniichi

  Ic Division Nippon Electric Company Ltd.

• Hamano Kuniyuki

  Ic Division Nippon Electric Co. Ltd.

• Hamano Kuniyuki

  Ic Division Nippon Electric Company Ltd.

関連論文

• Oxidation Process of Porous Silicon
• Oxygen Sensitivity of Porous Silicon Formed by Anodic Reaction
• Electronic Processes in Metal-Silicon Nitride-Silicon Dioxide-Silicon Systems
• Electronic Processes in MNOS System (II) Transitions between the Types of C-V, I-V and G-V Characteristics
• Electrical Properties of MAOS Structures as Revealed by Conductance Technique
• Broadening of Landau Levels in Two-Dimensional Electron Gas : Its Effect on Surface Capacitance

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