The Crystal Growth of Homogeneous Hg_<1-x>Cd_xTe by the Bridgman Method

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1972-02-05

著者

• SHINOHARA Koji

  Fujitsu Laboratories Ltd.

• UEDA Ryuichi

  Fujitsu Laboratories Ltd.

• OHTSUKI Osamu

  Fujitsu Laboratories Ltd.

• Ueda Yoichi

  Fujitsu Laboratories

• Ueda Yoichi

  Fujitsu Laboratories Ltd.

• Ueda Yoichi

  Fujitsu Labolatories Ltd.

• Ohtsuki Osamu

  Fujitsu Labolatories Ltd.

• Shinohara Koji

  Fujitsu Laboratories Lid.

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• Electroreflectance Measurements on Cd_xHg_Te
• High Sensitivity Short-Path Monitoring of Trace Gases Employing PbSnTe Tunable Diode Laser
• The Crystal Growth of Homogeneous Hg_Cd_xTe by the Bridgman Method
• Hall Effect in Hg_Cd_xTe
• Anomalous Hall Effect in Hg_Cd_xTe
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• The Operational Mode in a Buried-Channel Charge-Coupled Device

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