Precipitates with a Defect Structure in Thin Film of NiO
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概要
- 論文の詳細を見る
Thin films of single crystal of NiO are prepared by the method initiated by Cech and Alessandrini. The films are heated at 1400〜1600℃ in air and are examined by means of electron microscopy and electron diffraction. Many coherent particles of a second phase with characteristic shapes appear in the matrix film of NiO. They have a defect structure of Ni-deficient NiO, which is of spinel-type. Growth and morphology of the precipitates are observed and discussed.
- 社団法人応用物理学会の論文
- 1970-09-05
著者
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Katada Kinya
Department Of Materials Science University Of Osaka Prefecture
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Shimomura Yasumitsu
Department Of Physics College Of General Education University Of Osaka
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Nakahigashi Kiyotaka
Department Of Material Science University Of Osaka Prefecture
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NAKAHIGASHI Kiyotaka
Department of Physics, University of Osaka Prefecture
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SHIMOMURA Yasumitsu
Department of Physics , Naniwa University
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