Optimization of Multiplication Factor of Avalanche Photodiode
スポンサーリンク
概要
- 論文の詳細を見る
General formulas for the photomultiplication factor M_p are derived by considering the dark currernt injected into the avalanche region and the space charge effect due to the avalanche current. The numerical calculations were carried out in case of the silicon PN junction. The optimum impurity concentration to maximize M_p in the avalanche region is derived for a given junction area and a given load resistance. The analyses also indicate M_p is much improved with decreasing the dark current. The analytical results are well confirmed in the silicon P^+PNN^+ diode with an engraved guard ring. The junction uniformity was improved by gallium diffusion (P) preceding boron diffusion (P^+). Both the spatial variation of M_p in the junction plane and the avalanche noise were reduced to one tenth of those of the conventional P^+N junction diodes.
- 社団法人応用物理学会の論文
- 1970-05-05
著者
関連論文
- Photocapacitance Studies on Deep Levels in GaAs and Al_xGa_As Liquid Phase Epitaxial Layers
- Determination of the Composition of Ga_xAl_As from the Photoresponse of Schottky Barriers
- Threshold Current Density and Power Saturation in Read Diode
- Continuous Operation of Junction Lasers at Room Temperature
- Life Test of GaAs DH Lasers at Room Temperature
- Dislocation-Free Junctions Formed by Diffusing Gallium and Boron into Si
- Avalanche Multiplication Enhancement along Dislocation Lines in a Thermally Diffused Junction
- Correlation between Laser Performance and Crystal Homogeneities of Ruby Laser Rods
- Optimization of Multiplication Factor of Avalanche Photodiode
- Effect of Donor Density on Avalanche Photomultiplication in Silicon P^+N Junction