Density Profile and Fluctuation Measurements Using Microwave Reflectometry

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The microwave reflectometers on GAMMA 10 measure the density profile and fluctuations in the central-cell plasma. The density profile measurement using a broadband reflectometer is performed for various sweep times of the oscillator, 5ms-5μs. The reliability of the measurements seems to be improved when the sweep time is faster than 50-100μs. The resultant intermediate frequencies from a mixer output of the reflectometer are larger than 1MHz. The several reconstruction algorithms are used to analyze the fast time-varying data, such as, the maximum-entropy method(MEM)and wavelet analysis as well as the standard zero-cross fringe counting method. The integrated value of many reconstructed density profiles agrees well with the profile obtained from a scanning interferometer. The proof-of-principle experiment of an ultrashort-pulse reflectometry is also performed. The reflectometer is also applied to the measurement of density/magnetic fluctuations. The space- and time-resolving spectra of ICRF-driven waves as well as low-frequency waves are obtained. The density and magnetic-field fluctuation levels are evaluated from both the reflectometer and crosspolarization scattering(CPS)diagnostic method which is related to the mode-conversion effect consisting of a polarization difference of a scattered wave with regard to an incident wave by existence of magnetic fluctuations. It is observed that the Bragg resonance condition seems to be satisfied for the CPS similar to conventional Thomson scattering.
社団法人プラズマ・核融合学会の論文
1998-10-25

Density Profile and Fluctuation Measurements Using Microwave Reflectometry

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