Invited paper The Effect of Environmental Contamination on Gold Plated Contacts in Portable Electronic Devices (国際セッションIS--EMD 2003) -- (Session 1 Contact phenomena(1))

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概要

• 論文の詳細を見る

• Serious environmental contamination influenced the reliability of gold plated connectors in some portable electronic devices. Gold plated contacts disassembled from failed devices were tarnished and worn, contact resistance increased over design limitation. The element compositions of contaminants on gold plated contacts were complex, including C, O, Si, Al, S, Cl, K, Ca, Na, Mg and so on, which might be inorganic and organic compounds. Small part of them come from manufacturing and assembling process, others were mainly formed and deposited during customers' using periods.

• 社団法人電子情報通信学会の論文
• 2003-11-13

著者

• Zhou Yi-lin

  Lab Of Electric Contacts Beijing University Of Posts And Telecommunications

• He Zhan-ping

  Lab Of Electric Contacts Beijing University Of Posts And Telecommunications

• Zhang Ji-Gao

  Lab of Electric Contacts, Beijing University of Posts and Telecommunications

• Zhang J‐g

  Lab Of Electric Contacts Beijing University Of Posts And Telecommunications

• Zhang Ji-gao

  Research Lab.of Electric Contacts

• Zhang Ji-gao

  Lab Of Electric Contacts Beijing University Of Posts And Telecommunications

• Zhou Yi-lin

  Lab Of Electric Contacts Automation School Beijing University Of Posts And Telecommunications

関連論文

• The Resistance Characteristics on the Contaminated Gold Contacts in Handed Terminals (国際セッション IS-EMD2005) -- (Contact Phenomena)
• Invited paper The Effect of Environmental Contamination on Gold Plated Contacts in Portable Electronic Devices (国際セッションIS--EMD 2003) -- (Session 1 Contact phenomena(1))
• The Effect of Environmental Contamination on Gold Plated Contacts in Portable Electronic Devices
• Analysis of Connector Contact Failure(Recent Development of Electro-Mechanical Devices (IS-EMD 2002))

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