Analysis of Connector Contact Failure(<Special Issue>Recent Development of Electro-Mechanical Devices (IS-EMD 2002))

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概要

• 論文の詳細を見る

• Large number of electronic connectors are widely used in various electronic and telecommunication systems. No matter whether it is optical telecommunications or mobile phone systems, connectors are important links for electronics. Unfortunately connector contacts are exposed in air, they are different from any other electronic components, the contacts are greatly influenced by the environment where they operate. In China, dust and corrosion products are the main contaminants to cause contact failure. Evidently the failed contacts seriously deteriorate the reliability of electronic and telecommunication systems. This paper summarizes the recent achievements obtained by our Lab on the effect of dust and corrosion products to the connector contact failure. Since dust contamination is a very complex problem which is not only popular in China, but also happened in many countries. Continuous studies will be very useful to improve the contact reliability of connectors, setting up new and effective testing methods and standards, building up experimental and computer simulation systems.

• 社団法人電子情報通信学会の論文
• 2003-06-01

著者

• Gao Jin-chun

  Research Lab.of Electric Contacts

• Lin Xue-Yan

  Research Lab of Electric Contacts, Beijing University

• Lin Xue-yan

  Research Lab Of Electric Contacts Beijing University

• Lin Xue-yan

  Research Lab.of Electric Contacts

• Zhang J‐g

  Lab Of Electric Contacts Beijing University Of Posts And Telecommunications

• Zhang Ji-gao

  Research Lab.of Electric Contacts

関連論文

• Invited paper Computer and Lab Simulation of Particulate Effect on Electric Contact Reliability (国際セッションIS--EMD 2003) -- (Session 6 Contact Phenomena(2))
• Computer and Lab Simulation of Particulate Effect on Electric Contact Reliability
• Invited paper The Effect of Environmental Contamination on Gold Plated Contacts in Portable Electronic Devices (国際セッションIS--EMD 2003) -- (Session 1 Contact phenomena(1))
• The Effect of Environmental Contamination on Gold Plated Contacts in Portable Electronic Devices
• Analysis of Connector Contact Failure(Recent Development of Electro-Mechanical Devices (IS-EMD 2002))

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