The Effect of Environmental Contamination on Gold Plated Contacts in Portable Electronic Devices
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概要
- 論文の詳細を見る
- 2003-11-13
著者
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Zhou Yi-lin
Lab Of Electric Contacts Beijing University Of Posts And Telecommunications
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He Zhan-ping
Lab Of Electric Contacts Beijing University Of Posts And Telecommunications
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Zhang Ji-Gao
Lab of Electric Contacts, Beijing University of Posts and Telecommunications
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Zhang J‐g
Lab Of Electric Contacts Beijing University Of Posts And Telecommunications
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Zhang Ji-gao
Research Lab.of Electric Contacts
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Zhang Ji-gao
Lab Of Electric Contacts Beijing University Of Posts And Telecommunications
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Zhou Yi-lin
Lab Of Electric Contacts Automation School Beijing University Of Posts And Telecommunications
関連論文
- The Resistance Characteristics on the Contaminated Gold Contacts in Handed Terminals (国際セッション IS-EMD2005) -- (Contact Phenomena)
- Invited paper The Effect of Environmental Contamination on Gold Plated Contacts in Portable Electronic Devices (国際セッションIS--EMD 2003) -- (Session 1 Contact phenomena(1))
- The Effect of Environmental Contamination on Gold Plated Contacts in Portable Electronic Devices
- Analysis of Connector Contact Failure(Recent Development of Electro-Mechanical Devices (IS-EMD 2002))