The Resistance Characteristics on the Contaminated Gold Contacts in Handed Terminals (国際セッション IS-EMD2005) -- (Contact Phenomena)

概要

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Serious environmental contamination influenced the reliability of gold plated connectors in some handed terminals. Gold plated contacts disassembled from failed handed terminals were tarnished and worn. Contact resistance was tested on the crunodes of a rectangular lattice on contaminated contacts on printed circuit board (PCB). The contour distribution of contact resistance was consistent with the morphology of contaminants on the PCB contact, which was caused by the increased contact resistance on contamination. Contaminants causing failure usually located at or near the ends of wear tracks in contact zones, where the thickness of contaminants was highest. As the coverage areas of contamination expanded, the average thickness of contaminants increased, the value of contact resistance rose and the probability of higher contact resistance increased at same time. The distribution of contact resistance on PCB contacts was not complied with the normal distribution.
社団法人電子情報通信学会の論文
2005-11-10