A New Method for the Determination of the Extrinsic Resistances of MESFETs and HEMTs from the Measured S-Parameters under Active Bias

概要

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A new method is proposed for determining the parasitic extrinsic resistances of MESFETs and HEMTs from the measured S-parameters under active bias. The proposed method is based on the fact that the difference between drain resistance (R_d) and source resistance (R_s) can be found from the measured S-parameters under zero bias condition. It is possible to define the new internal device including intrinsic device and three extrinsic resistances by eliminating the parasitic imaginary terms. Three resistances can be calculated easily via the presented explicit three equations, which are induced from the fact that 1) the real parts of Y_<int,11> and Y_<int,12> of intrinsic Y-parameters are very small or almost zero, 2) the transformation relations between S-, Z-, and Y-matrices. The modelled S-parameters calculated by the obtained resistances and all the other equivalent circuit parameters are in good agreement with the measured S-parameters up to 40 GHz.
社団法人電子情報通信学会の論文
2002-03-01