Two-Pattern Test Capabilities of Autonomous TGP Circuits (Special Issue on VLSI Testing and Testable Design)

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概要

• 論文の詳細を見る

• A method to analyze two-pattern test capabilities of autonomous test pattern generator (TPG) circuits for use in built-in self-testing are described. The TPG circuits considered here include arbitrary autonomous linear sequential circuits in which outputs are directly fed out from delay elements. Based on the transition matrix of a circuit, it is shown that the number of distinct transitions in a subspace of state variables can be obtained from rank of the submatrix. The two-pattern test capabilities of LFSRs, cellular automata, and their fast parallel implementation are investigated using the transition coverage as a metric. The relationships with dual circuits and reciprocal circuits are also mentioned.

• 社団法人電子情報通信学会の論文
• 1993-07-25

著者

• Furuya Kiyoshi

  Faculty Of Science And Engineering Chuo University

• Mccluskey EdwardJ.

  Center for Reliable computing, Computer Systems Laboratory, Stanford University

• Mccluskey Edwardj.

  Center For Reliable Computing Computer Systems Laboratory Stanford University

関連論文

• Design of Autonomous TPG Circuits for Use in Two-Pattern Testing
• Stuck-Open Fault Detectabilities of Various TPG Circuits for Use in Two-Pattern Testing
• Two-Pattern Test Capabilities of Autonomous TGP Circuits (Special Issue on VLSI Testing and Testable Design)

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