Stuck-Open Fault Detectabilities of Various TPG Circuits for Use in Two-Pattern Testing

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概要

• 論文の詳細を見る

• Transition coverage has been proposed as a measure of two-pattern test capabilities of TPG circuits for use in BIST. This paper investigates experimentally the relationships between transition coverages and actual stuck-open fault cover-ages in order to reveal what kind of circuits are appropriate for two-pattern testing. Fault simulation was performed using conventional (n-stage) LFSR, 2n-stage LFSR, and one-dimensional cellular automata (CAs) as TPG circuits and such sample circuits as balanced NAND tree and some ISCAS '85 benchmark circuits as CUTs. It was found that CAs which are designed so as to apply exhaustive transitions to any 3-dimensional subspaces can detect high rate of stuck-open faults. Influence of hazards of decreasing the fault coverage is also mentioned.

• 社団法人電子情報通信学会の論文
• 1995-07-25

著者

• Furuya Kiyoshi

  Faculty Of Science And Engineering Chuo University

• Yamazaki Susumu

  Faculty of Science and Engineering, Chuo University

• Sato Masayuki

  Faculty of Science and Engineering, Chuo University

• Yamazaki Susumu

  Faculty Of Science And Engineering Chuo University

• Sato Masayuki

  Faculty Of Science And Engineering Chuo University

関連論文

• Design of Autonomous TPG Circuits for Use in Two-Pattern Testing
• Stuck-Open Fault Detectabilities of Various TPG Circuits for Use in Two-Pattern Testing
• Two-Pattern Test Capabilities of Autonomous TGP Circuits (Special Issue on VLSI Testing and Testable Design)

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