Furuya Kiyoshi | Faculty Of Science And Engineering Chuo University
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概要
関連著者
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Furuya Kiyoshi
Faculty Of Science And Engineering Chuo University
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Seki Seiji
新情報処理開発機構 つくば研究センター
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Seki Seiji
Faculty of Science and Engineering, Chuo University
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McCluskey Edward
Computer Systems Laboratory, Stanford University
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Yamazaki Susumu
Faculty of Science and Engineering, Chuo University
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Sato Masayuki
Faculty of Science and Engineering, Chuo University
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Mccluskey EdwardJ.
Center for Reliable computing, Computer Systems Laboratory, Stanford University
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Mccluskey Edwardj.
Center For Reliable Computing Computer Systems Laboratory Stanford University
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Yamazaki Susumu
Faculty Of Science And Engineering Chuo University
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Seki Seiji
Faculty Of Science And Engineering Chuo University
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Sato Masayuki
Faculty Of Science And Engineering Chuo University
著作論文
- Design of Autonomous TPG Circuits for Use in Two-Pattern Testing
- Stuck-Open Fault Detectabilities of Various TPG Circuits for Use in Two-Pattern Testing
- Two-Pattern Test Capabilities of Autonomous TGP Circuits (Special Issue on VLSI Testing and Testable Design)