Single Byte Error Correcting Codes with Double Bit within a Block Error Correcting Capability for Memory Systems
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概要
- 論文の詳細を見る
Existing byte error control codes require too many check bits if applied to a memory system that uses recent semiconductor memory chips with wide I/O data such as 16 or 32 bits, i.e., b = 16 or 32. On the other hand, semiconductor memory chips are highly vulnerable to random double bit within a memory chip errors when they are used in some applications, such as satellite memory systems. Under this situation, it becomes necessary to design suitable new codes with double bit within a chip error correcting capability for computer memory systems. This correspondence proposes a class of codes called Double bit within a block Error Correcting - Single b-bit byte Error Correcting ((DEC)_B-S_bEC) codes where block and byte correspond to memory chip and memory sub-array data outputs, respectively. The proposed codes provide protection from both random double bit errors and single sub-array data faults. For most of the practical cases, the (DEC)_B-S_bEC codes presented in this correspondence have the capability of accommodating the check bits in a single dedicated memory chip.
- 社団法人電子情報通信学会の論文
- 2002-02-01
著者
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FUJIWARA Eiji
Graduate School of Information Science and Engineering, Tokyo Institute of Technology
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Fujiwara Eiji
Graduate School Of Information Science And Engineering Tokyo Institute Of Technology
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Umanesan Ganesan
Graduate School Of Information Science And Engineering Tokyo Institute Of Technology
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