Defect-Tolerant WSI File Memory System Using Address Permutation for Spare Allocation

概要

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This paper proposes a large capacity high-speed file memory system implemented with wafer scale RAM which adopts a novel defect-tolerant technique. Based on set-associative mapping, the defective memory blocks on the wafer are repaired by switching with the spare memory blocks. In order to repair the clustered defective blocks, these are permuted logically with other blocks by adding some constant value to the input block addresses. The defective blocks remaining even after applying the above two methods are repaired by using error control codes which correct soft errors induced by alpha particles in an on-line operation as well as hard errors induced by the remaining defective blocks. By using the proposed technique, this paper demonstrates a large capacity high-speed WSI file memory system implemented with high fabrication yield and low redundancy rate.
社団法人電子情報通信学会の論文
1995-02-25