Recent Advances in Measurement Techniques for Microwave Active Devices and Circuits(<Special Section>Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)

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Recent advances in measurement techniques for microwave active devices and circuits are reviewed in this paper. The R&D activities have been devoted aggressively how to characterize nonlinear performance of high power devices and circuits. They are pulsed I-V, a variety of load-pull measurements, probing, sampling, and sensing techniques, supported by the recent significant advances in DSP (Digital Signal Processing), RF components, semiconductor devices, etc. The recent advances in vector network analyzers are of our great interest. They are (a) multi-port vector network analyzers for characterizing mixers, differential devices, packaged components, electronic package characterization, and multi-layer transmission lines, and (b) EO (Electro-Optic) modulated vector network analyzers for characterizing electronic performance of EO devices with the aid of EO modulators and photonic probes. In addition, probing, sampling, and sensing techniques have made great progress to directly measure electromagnetic field, time-domain voltage wave form, and temperature in small spot areas. In this paper, some topics related to these measurement techniques are briefly reviewed. Then the existing and future issues for characterization and measurement techniques of microwave active devices and circuits are discussed.
社団法人電子情報通信学会の論文
2004-05-01