Efficient DDD-Based Interpretable Symbolic Characterization of Large Analog Circuits(Analog Design)(<Special Section>VLSI Design and CAD Algorithms)
スポンサーリンク
概要
- 論文の詳細を見る
systematic and efficient approach is presented to generating simple yet accurate symbolic expressions for transfer functions and characteristics of large linear analog circuits. The approach is based on a compact determinant decision diagram (DDD) representation of exact transfer functions and characteristics. Several key tasks of generating interpretable symbolic expressions-DDD graph simplification, term de-cancellation, and dominant-term generation-are shown to be able to perform linearly by means of DDD graph operations. An efficient algorithm for generating dominant terms is presented based on the concepts of finding the k-shortest paths in a DDD graph. Experimental results show that our approach outperforms other start-of-the-art approaches, and is capable of generating interpretable expressions for typical analog blocks in minutes on modern computer workstations.
- 社団法人電子情報通信学会の論文
- 2003-12-01
著者
-
Tan S
Univ. California Ca Usa
-
Tan Sheldon
Department Of Electrical Engineering University Of California
-
Shi C.-j.
Department Of Electrical Engineering University Of Washington
関連論文
- A Fast Delay Computation for the Hybrid Structured Clock Network(VLSI Design Technology and CAD)
- Fast Analysis of On-Chip Power Grid Circuits by Extended Truncated Balanced Realization Method
- A Fast Decoupling Capacitor Budgeting Algorithm for Robust On-Chip Power Delivery(Physical Design)(VLSI Design and CAD Algorithms)
- Automatic Extraction of Layout-Dependent Substrate Effects for RF MOSFET Modeling(Device Modeling)(VLSI Design and CAD Algorithms)
- Partial Random Walks for Transient Analysis of Large Power Distribution Networks(Physical Design)(VLSI Design and CAD Algorithms)
- Efficient DDD-Based Interpretable Symbolic Characterization of Large Analog Circuits(Analog Design)(VLSI Design and CAD Algorithms)
- Efficient DDD-Based Interpretable Symbolic Characterization of Large Analog Circuits