Measurement of a Depth Profile in a Random Medium Using Coherent Backscattering of Light(Special Issue on Problems of Random Scattering and Electromagnetic Wave Sensing)
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概要
- 論文の詳細を見る
An averaged intensity peak profile of light scattered from a random medium depends on a thickness of a sample as well as parameters such as a volume fraction and a size of particles composing the medium. We used this dependence to measure a depth profile varied in the random medium. We demonstrated the possible simultaneous measurement of a transport mean free path and a depth of an aqueous suspension of titanium particles.
- 社団法人電子情報通信学会の論文
- 2000-12-25
著者
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Okamura Yasuyuki
Faculty Of Engineering Science Osaka University
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Okamura Yasuyuki
Faculty Of Systems Engineering Wakayama University
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YAMAMOTO Sadahiko
Graduate School of Engineering Science, Osaka University
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Yamamoto Sadahiko
Graduate School Of Engineering Science Osaka University
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