Electro-Optic Testing Technology for High-Speed LSIs (Special Issue on Ultra-High-Speed LSIs)
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概要
- 論文の詳細を見る
With increases in the speed of semiconductor devices and integrated circuits, the importance of internal testing with suffiicient temporal resolution has been growing. This paper describes recently established electro-optic testing technologies based on pulse lasers and electro-optic crystal probes. Practicability, limitation and future issues are discussed.
- 社団法人電子情報通信学会の論文
- 1996-04-25
著者
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NAGATSUMA Tadao
NTT LSI Laboratories
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NAGATSUMA Tadao
The author is with NTT Telecommunications
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NAGATSUMA Tadao
NTT Advanced Technology Corp.
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Nagatsuma T
Ntt Advanced Technology Corp.
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