Measurement of High-Speed Devices and Integrated Circuits Using Electro-Optic Sampling Technique (Special Issue on Opto-Electronics and LSI)

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概要

• 論文の詳細を見る

• Recent progress in high-speed semiconductor devices and integrated circuits (ICs) has outpaced the conventional measuring and testing instruments. With advent of ultrashort-pulse laser technology, the electro-optic sampling (EOS) technique based on the Pockels effect has become the most promising solution way of overcoming the frequency limit, whose bandwidth is approaching a terahertz. This paper reviews recent progress on the research of the EOS techniques for measuring ultrahigh-speed electronic devices and ICs. It describes both the principle of the EOS and the key technologies used for noncontact probing of ICs. Internal-node measurements of state-of-the-art high-speed ICs are also presented.

• 社団法人電子情報通信学会の論文
• 1993-01-25

著者

• NAGATSUMA Tadao

  NTT LSI Laboratories

関連論文

• External Electro-Optic Sampling Using Poled Polymers
• Optical Sampling of Electrical Signals in Poled Polymeric Media (Special Issue on Optical/Microwave Interaction Devices, Circuits and Systems)
• Electro-Optic Testing Technology for High-Speed LSIs (Special Issue on Ultra-High-Speed LSIs)
• Measurement of High-Speed Devices and Integrated Circuits Using Electro-Optic Sampling Technique (Special Issue on Opto-Electronics and LSI)

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