Measurement of the Intensity in Electron Diffraction by a CdS Single Crystal
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概要
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A method of measuring the intensity of electron in electron diffraction patterns by the electron-bombardment-induced-current(EBIC) in a CdS single crystal is described. The CdS detector is moved in the diffraction camera by a screw which is driven by a synchronous motor. EBIC is measured directly by a automatic recording millivoltmeter. EBIC properties of good crystals selected from those prepared by Frerichs' method are given. It is shown that the intensity can be measured within 2-3% error, if suitable precautions are made. An example of the measurement on TlCl is also given.
- 社団法人日本物理学会の論文
- 1960-09-05
著者
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Takagi Satio
Institute Of Physics College Of General Education University Of Tokyo
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Fujimoto Fuminori
Institute Of Physics College Of General Education University Of Tokyo
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Takagi S.
Institute of Physics, College of General Education, University of Tokyo
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