222-Reflection from CuCl in Electron Diffraction

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概要

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• The 222-reflection of electron diffraction from CuCl is theoretically and experimentally studied. Ratio of the integrated intensity of the 222-reflection to that of the 111-reflection is calculated by expansion of the scattering matrix and by the solution of Mathieu equation. Calculated results by the both methods agree sufficiently with each other up to the grain size 140 A for 41.3 kV electrons. The CdS detector and, in addition, the CdS monitor are used in the intensity measurement. The experimental values of the integrated intensity are found to be smaller than the theoretical values at small grain sizes of crystallites. It is, however, confirmed that the ratio of integrated intensity of the 222-reflection to that of the 111-reflection is nearly proportional to the square of grain size and the wave-length, in qualitative accordance with theory.

• 社団法人日本物理学会の論文
• 1961-05-05

著者

• Fujimoto Fuminori

  Institute Of Physics College Of General Education University Of Tokyo

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