Determination of Order Parameter and Atomic Scattering Factor in FeAl from Thickness Fringes in Electron Micrographs
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概要
- 論文の詳細を見る
Thickness fringes in electron micrographs are utilized together with the X-raytechnique for determining the order parameter and the difference between theatomic scattering factors of Fe and Al atoms for the first-order superlatticereflexion in Feel with a 7l?2-type superlattice. A parameter t7,. which representsthe relative position of the mth thickness fringe of the superlattice reflexion isdetermined at 250-1250 kV. The dependence of r7. on the accelerating voltage canbe expressed in terms of the electron structure factor of the superlattice reflexionwith the many-beam dynamical theory. The X-ray structure factor is also mea-sured. Thus the order parameter and the difference between the atomic scatteringfactors are related to and estimated from the both structure factors with accuraciesbetter than 2 '7Q and 0.5 '3, respectively.
- 社団法人日本物理学会の論文
- 1978-11-15
著者
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Kinoshita Chiken
Department Of Nuclear Engineering Kyushu University
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Kinoshita Chiken
Department Of Nuclear Engineering Faculty Of Engineering Kyushu University
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Kinoshita Chiken
Department Of Applied Quantum Physics And Nuclear Engineering Kyushu University
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MUKAI Toshio
Department of Nuclear Engineering,Faculty of Engineering Kyushu University
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KITAJIMA Sadakichi
Department of Nuclear Engineering,Faculty of Engineering Kyushu University
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Mukai Toshio
Department Of Nuclear Engineering Faculty Of Engineering Kyushu University
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Kitajima Sadakichi
Department Of Nuclear Engineering Faculty Of Engineering Kyushu University
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Mukai Toshio
Department of Chemistry, Faculty of Science Tohoku University
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