Contrast of Kikuchi Bands above and below the Critical Voltage

概要

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Electron diffraction patterns including the 111 systematic Kikuchi bands from relatively thin (≲2000Å) nickel crystals are taken at symmetric incidence below (100 and 195kV) and above (335, 385 and 470kV) the critical voltage for the 222 reflection, E_c=295kV. As is usually observed, all bands except the 222 band are defect near the incident spot and excess far from it at any accelerating, E. On the other hand, the 222 band is excess very near the 1^^-1^^-1^^- and 111 reflection spots, defect in the intermediate region and again excess far from the incident spot for E<E_c. For E>E_c, its contrast reverses in the first and second regions and becomes hardly observable in the third region. The observed behaviour of contrast is interpreted by considering the many-beam effect and the crystal structure factor for Kikuchi pattern.
社団法人日本物理学会の論文
1973-05-05