Dissociation of Oxide-Coated Cathode by Primary Electron Bombardment
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概要
- 論文の詳細を見る
- 社団法人日本物理学会の論文
- 1952-08-25
著者
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Takeda Ikuo
Electrical Communication Laboratory
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Takeda Ikuo
Electrical Communication Laboratory Ministry Of Telecommunication
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YOSHIDA Shigetomo
Electrical Communication Laboratory
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ARATA Hikaru
Electrical Communication Laboratory, Ministry of Telecommunication
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Arata Hikaru
Electrical Communication Laboratory
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Arata Hikaru
Electrical Communication Laboratory Ministry Of Telecommunication
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Yoshida Shigetomo
Electrical Communication Laboratory Ministry Of Telecommunication
関連論文
- Secondary Electron Emission from Oxide-Coated Cathode
- Dissociation of Oxide-Coated Cathode by Primary Electron Bombardment
- Distribution of Dislocations near the Junction Formed by Diffusion of Phosphorus in Silicon
- The Use of Radioactive Isotope in a Study of Evolution of Strontium Oxide under Electron Bombardment
- Observations of Dislocations in Phosphorus-Diffused Silicon by X-Ray and Etching Techniques
- Properties of Surface Imperfections Produced on Germanium by Cleaning Treatments