On the Lamellar Reflectivity and Phase Shift for Multiple Reflections

スポンサーリンク

概要

• 論文の詳細を見る

• An expression for calculating the lamellar reflectivity of a single layer on a surface of metal is given by extending Nathanson and Bartberger's equation. Then, interpreting this expression as reflectivity for a surface of hypothetical medium with an "effective refractive index", we calculated the reflectivity and the phase shift due to the reflection of two or more thin films on a surface of metal and the results were compared with the experiments of A. F. Turner and G. Hass. It was ascertained that the results of calculation show a good eoincidence with the experimental data, except in case of very thin aluminium film, in which the optical constants different from those of bulk aluminium must be used. This method of ealculation is useful for producing the interference filter, and reflection increasing or reducing by multilayer films, etc. Finally, from the result of the calculation, a method of obtaining a reflection-type interference filter using ZnS was induced.

• 社団法人日本物理学会の論文
• 1952-02-25

著者

• Nawata Shigenori

  The Research Institute For Scientific Measurement

• Nawata Shigenori

  The Research Institute For Scientific Mesurements University Of Tohoku

関連論文

• On the Interference Color of a Dielectric Layer on Metal Surface
• On the Distribution of Temperature in the Neighbourhood of Heated Cylinder
• Experimental Studies of Edge Effect and Contrast in Phase Microscope. I
• On the Lamellar Reflectivity and Phase Shift for Multiple Reflections
• Experimental Studies of Edge Effect and Contrast in Phase Microscope. II : On the Image in Metastable Region
• On the Phase Shift Accompanying Reflection of Light from Evaporated Films and the Change of Effective Refractive Index as Function of the Thickness of Deposit
• On the Bristers Produced on the Evaporated Aluminium Film
• On the Lamellar Reflectivity for Multiple Reflections

スポンサーリンク