Absolute Measurement of Structure Factors of Si Single Crystal by Means of X-Ray Pendellosung Fringes

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概要

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• Structure factors of Si single crystal were measured absolutely by means of Pendellosung fringes, the method being entirely free from the ambiguity of extinction. The causes of slight but systematic discrepancy recongnized in the previous work (N. Kato and A. R. Lang: Acta cryst. 12 (1959) 787) were elucidated. For eliminating the causes of errors, the section pattern was used. The structure factors obtained agree well with Gottlicher et al's values which were obtained by the usual X-ray method. This implies that the Debye-Waller factor to be used in dynamical diffraction theory should be the same one as the factor adequate to the kinematical theory. The Debye temperature Θ_M for X-ray diffraction is determined to be 538°K. at room temperature. Based on the structure factors obtained, it is also concluded that a kind of scattering factor f_ε of the bonding charge assumed at the middle of the <111>-bond can be represented in the form f_ε=0.45 exp - 13 (sinθ/λ)^2.

• 社団法人日本物理学会の論文
• 1965-06-05

著者

• KATO NORIO

  Department of Urology, Komaki Shimin Hospital

• Kuriyama Late

  Department Of Applied Physics Faculty Of Engineering Nagoya University

• Kato Norio

  Department Of Crystalline Materials Science Faculty Of Engineering Nagoya University

• HATTORl Hiroyuki

  Department of Applied Physics, Faculty of Engineering, Nagoya University

• KATAGAWA Takeshi

  Department of Applied Physics, Faculty of Engineering, Nagoya University

• Katagawa Takeshi

  Department Of Applied Physics Faculty Of Engineering Nagoya University

• Hattorl Hiroyuki

  Department Of Applied Physics Faculty Of Engineering Nagoya University

• Kato Norio

  Department Of Applied Physics Faculty Of Engineering Nagoya University

• KATO Norio

  Department of Applied Physics, Faculty of Engineering, Nagoya University

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