<報文>X線フーリェ解析の非晶質SiO_2およびB_2O_3への応用

概要

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This report presents an experimental procedure in X-ray diffraction study to determine the atomic distribution in polyatomic non-crystalline materials and a discussion on the structures of vitreous silica and boron oxide. Structures of vitreous silica and boron oxide have been obtained by X-ray Fourier analysis method. After calculating the interference function, the electron radial distribution function was evaluated from which interatomic distance and coordination number were obtained. From these results the following facts have been obtained ; The vitreous silica consists of SiO_3 tetrahedral units randomly distributed, namely each silicon is surrounded by four oxygens at a distance 1.53Å. on the other, the vitreous boron oxide consists ot BO_3 triangular units, namely each boron is located at the center of a triangle of three oxygens and the B-O distance is 1.40 Å.
東北大学の論文
1972-03-25