<研究論文>歯科用アマルガムの電位走査曲線 : 電位走査範囲卑な側について

概要

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Polarization behavior of dental amalgams in 0.86% sodium chloride solutions were studied by the potential sweep method with a sweep rate of 200mV/s and anodic potential scan limit 0.0V (SCE). The dental amalgam electrodes studied were prepared from two conventional amalgam alloys and three high-copper amalgam alloys according to the manufacturers' instructions in regard to mercury-alloy ratios and trituration times. The hydrogen evolution reaction on dental amalgams in 0.86% sodium chloride solution started at potential below -1.0V (SCE) by the first potential scan but the currents decreased with repeats of the potential scan. It indicated that the hydrogen evolution reaction did not occur on the suface of tin (II) oxide. Due to the generation of hydroxide ions with the hydrogen evolution reaction, substantial amounts of tin (II) oxide were formed on the surfaces of dental amalgams and inhibited the dissolution of tin in the conventional dental amalgams.
日本大学の論文
2001-12-25