Topological Characterization for Textured Surfaces of Transparent Conductive Oxides Based on Their Fractal Structures
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概要
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The topological properties of textured surfaces of transparent conductive oxide (TCO) thin films were characterized because they play a crucial role in determining the photovoltaic performances of Si-based, specifically microcrystalline silicon (μc-Si) thin-film solar cells. Using fractal structures of TCO surfaces, the average slopes $\tan\theta$ are determined from the roughness-to-lateral-correlation-length ratios. Various TCO surfaces were successfully characterized as a function of $\tan\theta$. The defect densities of μc-Si thin films deposited on textured TCO surfaces with different $\tan\theta$ can be expressed as the sigmoid function, which is discussed as a chaotic behavior in the defect formation.
- 2010-05-25
著者
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Toyama Toshihiko
Osaka Univ. Osaka Jpn
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Toyama Toshihiko
Department Of Physical Science Graduate School Of Engineering Science
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