High-Rate Oblique Deposition of SiO_2 Films Using Two Sputtering Sources
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概要
- 論文の詳細を見る
- 2008-10-01
著者
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Yagi Kensuke
Tokyo Polytechnic University
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HOSHI Yoichi
Tokyo Polytechnic University
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SUZUKI Eisuke
Tokyo Polytechnic University
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LEI Hao
Tokyo Polytechnic University
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SAKAI Akira
Leading-Edge Technology Development Headquarters, Canon Inc.
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Sakai Akira
Leading-edge Technology Development Headquarters Canon Inc.
関連論文
- High-Rate Oblique Deposition of SiO_2 Films Using Two Sputtering Sources
- Investigation of Low-Damage Sputter-Deposition of ITO Films on Organic Emission Layer
- High Rate Sputter-Deposition of TiO_2 Films Using Oxide Target(Recent Progress in Oxide Thin Films by Sputtering)
- Special Section on Recent Progress in Oxide Thin Films by Sputtering
- Photocatalytic Characteristics of TiO2 Films Deposited by Oxygen Plasma-Assisted Reactive Evaporation Method
- Control of Nano-Structure of Photocatalytic TiO₂ Films by Oxygen Ion Assisted Glancing Angle Deposition (SELECTED TOPICS IN APPLIED PHYSICS : Nano Electronics and Devices : Characterization and Control of Nano Surfaces and Interfaces)
- Control of Nano-Structure of Photocatalytic TiO