Enhanced NBTI Degradation by SMT in Short-Channel pMOSFET
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概要
- 論文の詳細を見る
- 2007-09-19
著者
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Lim Peng-soon
Taiwan Semiconductor Manufacturing Company Hsinchu Science Park
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HUANG Chen-Shuo
Institute of Electro-Optical Engineering, National Chiao Tung University
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LIU Po-Tsun
Department of Photonics and Display Institute, National Chiao Tung University
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CHEN Chi-Chun
Taiwan Semiconductor Manufacturing Company, Hsinchu Science Park
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TAO H.
Taiwan Semiconductor Manufacturing Company, Hsinchu Science Park
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MII Y.
Taiwan Semiconductor Manufacturing Company, Hsinchu Science Park
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Liu Po-tsun
Department Of Photonics And Display Institute National Chiao Tung University
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Huang Chen-shuo
Institute Of Electro-optical Engineering National Chiao Tung University
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Chen Chi-chun
Taiwan Semiconductor Manufacturing Company Hsinchu Science Park
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Mii Y.
Taiwan Semiconductor Manufacturing Company Hsinchu Science Park
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Liu Po-Tsun
Department of Electronics Engineering and Institute of Electronics, National Chiao-Tung University
関連論文
- Enhanced NBTI Degradation by SMT in Short-Channel pMOSFET
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