Recovery Dynamics Analysis of Saturable Absorber Optical Gates by Optical Sampling

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概要

• 論文の詳細を見る
• 1999-09-20

著者

• YAMADA Hirohito

  Optoelectronic Industry and Technology Development Association (OITDA)

• Yamada Hirohito

  Fundamental And Environmental Research Laboratories Nec Corporation

• Shirane Masayuki

  Fundamental And Environmental Research Laboratories Nec Corporation

• YOKOYAMA Hiroyuki

  Optoelectronics and High Frequency Device Research Laboratories, NEC Corporation the Institute of Ph

• SHIRANE Masayuki

  Optoelectronics and High Frequency Device Research Laboratories, NEC Corporation

• HASHIMOTO Yoichi

  Optoelectronics and High Frequency Device Research Laboratories, NEC Corporation

• Hashimoto Y

  System Platforms Research Laboratories Nec Corporation

• Yamada Hirohito

  Optoelectronic Ind. And Technol. Dev. Assoc. (oitda) Ibaraki Jpn

• Yokoyama H

  Fundamental And Environmental Research Laboratories Nec Corporation

• Yokoyama Hiroyuki

  Optoelectronics And High Frequency Device Research Laboratories Nec Corporation The Institute Of Phy

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