Active Control of the Oxidization of a Silicon Cantilever for the Characterization of Silicon-based Semiconductors
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概要
- 論文の詳細を見る
- 2008-01-05
著者
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SAKATA Takao
Research Center for Ultra-high Voltage Electron Microscopy, Osaka University
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Kawata Satoshi
Nanophotonics Lab. Riken (the Institute Of Physical And Chemical Research)
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ICHIMURA Taro
Department of Applied Physics, Osaka University
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Verma Prabhat
Crest Japan Science And Technology
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ONO Atsushi
Nanophotonics Lab., RIKEN (The Institute of Physical and Chemical Research)
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MASUI Kyoko
Department of Applied Physics, Osaka University
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SAITO Yuika
Frontier Research Center, Osaka University
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TAGUCHI Atsushi
Nanophotonics Lab., RIKEN (The Institute of Physical and Chemical Research)
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MOTOHASHI Masashi
Nanophotonics Lab., RIKEN (The Institute of Physical and Chemical Research)
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ISHITOBI Hidekazu
Nanophotonics Lab., RIKEN (The Institute of Physical and Chemical Research)
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TARUN Alvarado
Nanophotonics Lab., RIKEN (The Institute of Physical and Chemical Research)
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HAYAZAWA Norihiko
Nanophotonics Lab., RIKEN (The Institute of Physical and Chemical Research)
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INOUYE Yasushi
CREST, Japan Science and Technology
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Saito Yuika
Frontier Research Center Osaka University
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Masui Kyoko
Department Of Applied Physics Osaka University
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Sakata Takao
Research Center For Ultra-high Voltage Electron Microscopy Osaka University
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Ichimura Taro
Department Of Applied Physics Osaka University
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Inouye Yasushi
Crest Japan Science And Technology
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Motohashi Masashi
Nanophotonics Lab. Riken (the Institute Of Physical And Chemical Research)
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Tarun Alvarado
Nanophotonics Lab. Riken (the Institute Of Physical And Chemical Research)
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Taguchi Atsushi
Nanophotonics Lab. Riken (the Institute Of Physical And Chemical Research)
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Hayazawa Norihiko
Nanophotonics Lab. Riken (the Institute Of Physical And Chemical Research)
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Ishitobi Hidekazu
Nanophotonics Lab. Riken (the Institute Of Physical And Chemical Research)
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Ono Atsushi
Nanophotonics Lab. Riken (the Institute Of Physical And Chemical Research)
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