Performance Degradation Induced by Fringing Field-Induced Barrier Lowering and Parasitic Charge in Double-Gate Metal-Oxide-Semiconductor Field-Effect Transistors with High-κ Dielectrics

スポンサーリンク

概要

著者

関連論文

Performance Degradation Induced by Fringing Field-Induced Barrier Lowering and Parasitic Charge in Double-Gate Metal-Oxide-Semiconductor Field-Effect Transistors with High-κ Dielectrics
Impact of Geometrical and Electrical Parameters on Speed Performance Characteristics in Ultimate Double-Gate Metal–Oxide–Semiconductor Field-Effect Transistors

スポンサーリンク