Autran Jean-Luc | L2MP, Bât. IRPHE, 49 rue Joliot-Curie, BP 146, 13384 Marseille Cedex 13, France

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概要

• Autran Jean-Lucの詳細を見る
• 同名の論文著者
• L2MP, Bât. IRPHE, 49 rue Joliot-Curie, BP 146, 13384 Marseille Cedex 13, Franceの論文著者

関連著者

• AUTRAN Jean-Luc

  L2MP, Bat. IRPHE

• Munteanu Daniela

  L2MP, Bât. IRPHE, 49 rue Joliot-Curie, BP 146, 13384 Marseille Cedex 13, France

• Autran Jean-Luc

  L2MP, Bât. IRPHE, 49 rue Joliot-Curie, BP 146, 13384 Marseille Cedex 13, France

• Castellani-coulie Karine

  L2mp Bat. Irphe

• MUNTEANU Daniela

  L2MP, Bat. IRPHE

• HOUSSA Michel

  IMEC

• CASTELLANI-COULIE Karine

  L2MP, Bat. IRPHE

• SAID Ahmed

  L2MP, Bat. IRPHE

• Said Ahmed

  L2mp Bat. Irphe

• Autran Jean-luc

  L2mp Bat. Irphe

• Munteanu Daniela

  L2mp Bat. Irphe

• Houssa Michel

  IMEC, Kapeldreef 75, B-3001 Leuven, Belgium

• Loussier Xavier

  L2MP, Bât. IRPHE, 49 rue Joliot-Curie, BP 146, 13384 Marseille Cedex 13, France

• Tintori Olivier

  L2MP, Bât. IRPHE, 49 rue Joliot-Curie, BP 146, 13384 Marseille Cedex 13, France

• Loussier Xavier

  L2MP, Bât. IRPHE, 49 rue Joliot-Curie, BP 146, 13384 Marseille Cedex 13, France

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著作論文

• Performance Degradation Induced by Fringing Field-Induced Barrier Lowering and Parasitic Charge in Double-Gate Metal-Oxide-Semiconductor Field-Effect Transistors with High-κ Dielectrics
• Impact of Geometrical and Electrical Parameters on Speed Performance Characteristics in Ultimate Double-Gate Metal–Oxide–Semiconductor Field-Effect Transistors

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