Evaluation of Complex Refractive Index of Metal Clusters by Scattering Ellipsometry

概要

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A scattering ellipsometry is a newly developed method to measure a complex refractive index of metal clusters at a high temperature region. The complex refractive index is required to determine a luminous efficacy, which is one of the most important factors to develop lamps, of cluster lamps. In this study, we built a scattering ellipsometer, and considered its accuracy of measurement through evaluations of the complex refractive index of gold particles at room temperature. In measurement, a Nd:YAG laser of 532 nm was used as the light source. The measured complex refractive index of gold particles was 0.31 in real part and 1.75 in imaginary part. A repeatable accuracy was evaluated 0.01 in real part and 0.02 in imaginary part from a standard deviation in measuring the complex refractive index 10 times in the same condition. Also, the size parameter of gold particles was 1.71, and its repeatable accuracy was 0.02. Such accuracy is sufficient to estimate characteristics of the cluster lamps, such as the spectral radiant flux, the luminous efficacy and so on.
社団法人電気学会の論文
2005-05-01