Imaging of a single atomic column in silicon grain boundary
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概要
- 論文の詳細を見る
- Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
- 2002-12-01
著者
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Sawada H
Department Of Materials Science The University Of Tokyo
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Sawada Hidetaka
Department Of Materials Science Faculty Of Engineering The University Of Tokyo
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ICHINOSE Hideki
Department of Materials Science, The University of Tokyo
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KOHYAMA Masanori
Special Division of Green Life Technology, National Institute of Advanced Industrial Science and Tec
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Ichinose Hideki
Department Of Materials Science The University Of Tokyo
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Ichinose Hideki
Department Of Materials Science And Engineering Tokyo University
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Kohyama Masanori
Special Division Of Green Life Technology National Institute Of Advanced Industrial Science And Tech
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