An aberration-free imaging technique based on focal depth extension
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概要
- 論文の詳細を見る
- Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
- 1998-10-01
著者
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Ikuta Takashi
Department Of Applied Physics Osaka University
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Ikuta Takashi
Department Of Applied Physics Faculty Engineering Osaka University
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Ikuta Takashi
Department Of Lightwave Sciences Faculty Of Engineering Osaka Electro-communication University
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