Wide area mapping of uneven specimens in an electron probe X-ray microanalyser with wavelength dispersive spectrometers

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概要

• 論文の詳細を見る
• Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
• 1998-02-01

著者

• TAKAHASHI Hideyuki

  Application and Research Center, Electron Optics Division, JEOL Ltd.

• Okumura Toyohiko

  Application And Research Center Electron Optics Division Jeol Ltd

• Takahashi Hideyuki

  Application And Research Center Electron Optics Division Jeol Ltd

関連論文

• A Novel Mapping Technique of Oxide Chemical States by Electron Probe Microanalysis
• State Analysis of Fluorides with Rare Earth Elements in Electron Probe X-Ray Microanalysis
• Application of Chemical State Mapping Technique with Electron Probe X-Ray Microanalyzer for BiSrCaCuO Superconductor
• Wide area mapping of uneven specimens in an electron probe X-ray microanalyser with wavelength dispersive spectrometers

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