Application of Chemical State Mapping Technique with Electron Probe X-Ray Microanalyzer for BiSrCaCuO Superconductor
スポンサーリンク
概要
- 論文の詳細を見る
High resolution O-Kα X-ray spectra obtained by electron probe X-ray microanalysis (EPMA) have been found to provide a detailed insight into the crystal structure of specimens. A practical approach for digital color mapping of the crystal structures is proposed, which uses the ratio of the intensities of two specific wavelengths to represent the spectral shape. An application of this approach to digital mapping for a BiSrCaCuO superconductor is presented. The results lead to a more comprehensive understanding of the micro-crystallinity of fine specimens.
- 社団法人応用物理学会の論文
- 1997-09-15
著者
-
TAKAHASHI Hideyuki
Application and Research Center, Electron Optics Division, JEOL Ltd.
-
Okumura Toyohiko
Application And Research Center Electron Optics Division Jeol Ltd.
-
Okumura Toyohiko
Application And Research Center Electron Optics Division Jeol Ltd
-
Takahashi Hideyuki
Application And Research Center Electron Optics Division Jeol Ltd.
-
Takahashi Hideyuki
Application And Research Center Electron Optics Division Jeol Ltd
関連論文
- A Novel Mapping Technique of Oxide Chemical States by Electron Probe Microanalysis
- State Analysis of Fluorides with Rare Earth Elements in Electron Probe X-Ray Microanalysis
- Application of Chemical State Mapping Technique with Electron Probe X-Ray Microanalyzer for BiSrCaCuO Superconductor
- Wide area mapping of uneven specimens in an electron probe X-ray microanalyser with wavelength dispersive spectrometers