State Analysis of Fluorides with Rare Earth Elements in Electron Probe X-Ray Microanalysis
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概要
- 論文の詳細を見る
The peak shapes of F-Kα for fluorides with rare earth elements are examined using electron probe X-ray microanalyser (EPMA). It is demonstrated that the F-Kα spectra in fluorine compounds from _<57>La to _<71>Lu indicate characteristic peak shapes and the intensity ratios of the satelite Kα_<3,4> to the main Kα increase with the number of valence electrons.
- 社団法人応用物理学会の論文
- 1998-04-15
著者
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Minato I
Application And Research Center Electron Optics Division Jeol Ltd.
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TAKAHASHI Hideyuki
Application and Research Center, Electron Optics Division, JEOL Ltd.
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Kondo Yuji
Application And Research Center Electron Optics Division Jeol Ltd.
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MINATO Ichiro
Application and Research Center, Electron Optics Division, JEOL Ltd.
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Takahashi Hideyuki
Application And Research Center Electron Optics Division Jeol Ltd
関連論文
- A Novel Mapping Technique of Oxide Chemical States by Electron Probe Microanalysis
- State Analysis of Fluorides with Rare Earth Elements in Electron Probe X-Ray Microanalysis
- Application of Chemical State Mapping Technique with Electron Probe X-Ray Microanalyzer for BiSrCaCuO Superconductor
- Wide area mapping of uneven specimens in an electron probe X-ray microanalyser with wavelength dispersive spectrometers