A Novel Mapping Technique of Oxide Chemical States by Electron Probe Microanalysis
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概要
- 論文の詳細を見る
- Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
- 1996-12-01
著者
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Takahashi H
Fujita Health Univ. Toyoake Jpn
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TAKAHASHI Hideyuki
Application and Research Center, Electron Optics Division, JEOL Ltd.
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OKUMURA Toyohiko
Application and Research Center, Electron Optics Division, JEOL Ltd.
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Okumura T
Jeol Ltd Tokyo Jpn
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Okumura Toyohiko
Application And Research Center Electron Optics Division Jeol Ltd
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Takahashi Hideyuki
Application And Research Center Electron Optics Division Jeol Ltd
関連論文
- A Novel Mapping Technique of Oxide Chemical States by Electron Probe Microanalysis
- State Analysis of Fluorides with Rare Earth Elements in Electron Probe X-Ray Microanalysis
- Application of Chemical State Mapping Technique with Electron Probe X-Ray Microanalyzer for BiSrCaCuO Superconductor
- Wide area mapping of uneven specimens in an electron probe X-ray microanalyser with wavelength dispersive spectrometers