Secondary Electron Detection Efficiency for Magnetic Lenses with a Retarding Electrostatic Field
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概要
- 論文の詳細を見る
- Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
- 1996-10-01
著者
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SHIMIZU Hiroyasu
2nd Development Department, IC Equipment Division, Nikon Corporation
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Nakasuji Mamoru
2nd Designing Department Ic & Lcd Equipment Division Ohi Plant Nikon Corporation
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Shimizu Hiroyasu
2nd Designing Department Ic & Lcd Equipment Division Ohi Plant Nikon Corporation
関連論文
- Electron Optics Properties of Electron Beam Stepper
- Symmetric Magnetic Doublet Optics with Dynamically Compensated Field Aberration for Reducing Image Projection System
- Optimization of Object-Image Distance for Aberration and Space-Charge Effect in Symmetric Magnetic Doublet with Dynamically Compensated Field Aberrations
- Secondary Electron Detection Efficiency for Magnetic Lenses with a Retarding Electrostatic Field
- Electron Optics Properties of Electron Beam Stepper